Gallery of Scans


https://docs.google.com/a/ccu-semicond.net/file/d/0B4xPZ2CBWWOZMXdzeTR0TXc1em8/edit?usp=drive_web

1. "Molecules" of InGaAs quantum dots on the surface of GaAs single crystal substrate. The scale bar is 50 nm.
Rare arrays of quantum dots, which interact with each other are structural elements of quantum optics. The size, shape and relative position is one of the key parameters that determine the properties of these tiny emitters and detectors of single photons. Structures were grown by molecular beam epitaxy based on a self-assembled growth.
https://docs.google.com/a/ccu-semicond.net/file/d/0B4xPZ2CBWWOZbFcwMXptazc5ZVE/edit?usp=drive_web
2. Graphene layer on the surface of silicon oxide substrate. Image obtained by scanning Kelvin probe force microscopy. The inset shows corresponding topography of the surface.
Graphene is one of the allotropic forms of carbon where atoms are arranged in a monoatomic layer. The potential applications ranges from the novel electronic devices to materials with new physical properties. Control of defects in the graphene layers is an important technological task. Kelvin probe microscopy allows to map the work function of the surface and thus visualize defects in the layer. The image of dark areas correspond to gaps in the layer and weak contrast fluctuations indicate a change in the number of monoatomic layers.
 
https://docs.google.com/a/ccu-semicond.net/file/d/0B4xPZ2CBWWOZMnZWNjliTEE4Y00/edit?usp=drive_web

3. Magnetic Force Microscopy (MFM) images of micro- and nanostructure of surfaces: magnetic stripe and bubble domains in the epitaxial film of yttrium iron garnet (bar 20 micron); magnetic recording of information on the 1.2 GB capacity  hard disk of  (bar 5 micron) and a capacity of 120 GB (bar 1 micron). 
One of the goals yttrium iron garnet application is their use in spintronics devices. MFM allows us to study the processes that occur in these structures depending on processing parameters and under direct modification. In the field of magnetic recording media MFM can act as a diagnostic device and as a tool for superdense recording/reading information.
 
https://docs.google.com/a/ccu-semicond.net/file/d/0B4xPZ2CBWWOZU0diMTJtNUlPd0E/edit?usp=drive_web

4. Image of the surface and the corresponding currier concentration map of the  SDRAM memory cells obtained by Scanning Capacitance Microscopy (SCM). 
The most common standard SDRAM (synchronous dynamic random-access memory) is a DDR (double data rate) used in computer RAM. SCM captures maps of the dopants  distribution in semiconductor devices, recording their type and concentration, with high spatial resolution.