Equipment: Quadrexed NanoScope IIIa Dimension 3000TM Scanning Probe Microscope (Digital Instruments / Bruker, USA);
SPM modes:
- Atomic Force Microscopy (in air and in liquid media);
- Magnetic and Electrostatic Microscopy;
- Current sensing AFM and Capacitance Microscopy;
- Tunneling Microscopy and Spectroscopy (air);
- Force Spectroscopy (in air and in liquid media);
- Nanoindentation and mapping of elastic and adhesive properties of surfaces;
- Nanolithography and nano-manipulations.
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