Scanning Probe Microscopy


Equipment:

Quadrexed NanoScope IIIa Dimension 3000TM Scanning Probe Microscope (Digital Instruments / Bruker, USA);


SPM modes:
  • Atomic Force Microscopy (in air and in liquid media);
  • Magnetic and Electrostatic Microscopy;
  • Current sensing AFM and Capacitance Microscopy;
  • Tunneling Microscopy and Spectroscopy (air);
  • Force Spectroscopy (in air and in liquid media);
  • Nanoindentation and mapping of elastic and adhesive properties of surfaces;
  • Nanolithography and nano-manipulations.