Equipment:
Agilent 4284A (LCR- precision meter)Agilent 4156C (precision semiconductor analyzer)Optical microscope Axioskop 2 MAT mot (Sarl Zeiss, Germany).
Appointment:determination of electrophysical characteristics for semiconductor thin film heterostructures and low dimensional semiconductor devices.
Appointment:
determination of electrophysical characteristics for semiconductor thin film heterostructures and low dimensional semiconductor devices.