Electrophysical Diagnostics

Equipment:
  • Agilent 4284A (LCR- precision meter)
  • Agilent 4156C (precision semiconductor analyzer)
  • Optical microscope Axioskop 2 MAT mot (Sarl Zeiss, Germany).


Appointment:
determination of electrophysical characteristics for semiconductor thin film heterostructures and low dimensional semiconductor devices.